Speaker
Description
CEA LETI develops second-generation cooled infrared focal plane array (FPA) technologies for high-performance imagers, targeting defense, Earth observation from space, and astronomy. Our technology covers the infrared spectrum from Short-Wave InfraRed (SWIR) to Very Long Wave InfraRed (VLWIR, 18µm cutoff). The entire process flow, from substrate and epilayer growth to Read-Out Integrated Circuit (ROIC) design and hybridized array assembly, is performed in-house. To provide a comprehensive assessment of the technological choices explored, we employ state-of-the-art electro-optical characterization means and expertise. This capability is further supported by our in-house production of dedicated single diode test chips, as well as full arrays featuring multiple pixel designs. It allows us addressing not only first-order figures of merit (Quantum efficiency (QE), dark current, and temporal noise…) but also second-order performance metrics and exotic parameters. This presentation will focus on advanced characterization techniques specifically developed for astronomy. We will discuss SWIR QE metrology, Point Spread Function (PSF) and intra-pixel response characterization using spot-scan and Electron Beam Induced Current (EBIC) techniques, as well as persistence measurements and associated trap properties analysis. These methods enable a deeper understanding of detector performance and guide the optimization of infrared imaging technologies for demanding applications.